International Test Conference India 2019

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Location: Bangalore, India
Begin: July 21, 2019
End: July 23, 2019
Keywords: system test, design for test, manufacturing test, silicon debug
Submission Deadline: March 1, 2019
Abstract submission deadline: February 22, 2019
Abbreviation: ITC India 2019

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems — covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. This ITC India conference will be focusing on Test development in India but the submissions may not be limited to topics related to this region. Topics related to design and test development across multi geographical regions will be of special interest.


Please checkout the poster for details on submission guidelines, and key dates.


Contact


All questions about submissions should be emailed to itc-india-tpc@googlegroups.com

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